Détail de la notice
Titre du Document
How low can impurities in pure water be analyzed by ICP-MS?
Auteur(s)
KAWABATA Katsu ; KISHI Yoko
Résumé
Elements such as Si, B, Fe, K, and Ca are difficult to determine at levels lower than 1 pg/mL (ppt) using ICP-MS due to a high background. There are two sources of background: isobaric or polyatomic ion interferences due to plasma Ar and sample matrices, and contamination from sample introduction devices. Several techniques have been used for the elimination of isobaric and polyatomic ion interferences. High resolution ICP-MS can separate analytes from interferences, but some elements require an extremely high resolution, which sacrifices the sensitivity of the analytes. The cool plasma technique can eliminate interferences that have a higher ionization potential, but elements having a higher ionization potential or strong bond energy with oxygen cannot be determined. Dynamic reaction cell (DRC) technology can effectively reduce the interferences by chemical resolution that the cool plasma technique cannot. In addition, the non-extraction lens design allows for very low level B determination. In this paper, several sample introduction devices and operating conditions with the DRC-ICP-MS were evaluated to reduce background. The results of Si and B in pure waters clearly show the difference between the multiple water collection sites at less than ng/mL (ppb) level.
Editeur
Perkin Elmer
Identifiant
ISSN : 0195-5373 CODEN : ASPND7
Source
Atomic spectroscopy A. 2003, vol. 24, n° 2, pp. 73-77 [5 pages] [bibl. : 3 ref.]
Langue
Anglais
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